National High Magnetic Field Laboratory

Operated by Florida State University, University of Florida, Los Alamos National Laboratory

Florida State University, 1800 E. Paul Dirac Dr., Tallahassee, Florida 32310

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To: Tom Stalcup, NHMFL May 18th, 1998

Here are the concentrations (in ppm) on the adhesive and the leached adhesive. The trace element ratios are more accurate than the trace element concentrations. Concentrations are better than 20%, ratios are better than 10% precision. The exception is Mg in the adhesive. The adhesive has a large amount of Mg and our standards are not calibrated to include these high concentrations. Therefore, the error on the Mg in the adhesive is estimated at 50%. The detection limit for all elements are just several parts per billion.

Element
Leached Adhesive
Adhesive
B
1
53
Na
24
157
Mg
27
9657
Ti
2
7
Mn
dl
14
Ag
dl
dl
Sb
1
dl
Pb
dl
1
Al
18
82
Si
4
266
Ca
11
882
Cr
dl
2
Mn
dl
13
Fe
10
108
Ni
dl
1
Zn
2
2125

dl is detection limit



Methodology:

The samples were dissolved in a mixture of nitric, hydrochloric and hydrofluoric acid, dried down and taken up in 1% nitric acid. During this process a small (less than 1%) residue formed. Samples were analyzed with a magnetic sector inductive coupled plasma mass spectrometer (ICP-MS). The instrument was calibrated with commercially obtained ICP-MS standard solutions.




Vincent J.M. Salters
Science Scholar, National High Magnetic Field Laboratory
and Adjunct Professor, Department of Geology, Florida State University